olo_ft_cc_reset¶
Status Information¶
VHDL Source: olo_ft_cc_reset
Description¶
TMR-hardened clock crossing for resets, the fault-tolerant counterpart to olo_base_cc_reset with the same interface and behavior.
Reset on either side is asserted on the other clock domain immediately and de-asserted synchronously to the corresponding clock. The reset is clock-crossed in both directions.
Generics¶
| Name | Type | Default | Description |
|---|---|---|---|
| SyncStages_g | positive | 2 | Number of sync stages per TMR chain in the internal olo_ft_cc_bits (range 2-4). |
Interfaces¶
| Name | In/Out | Length | Default | Description |
|---|---|---|---|---|
| A_Clk | in | 1 | - | Clock of domain A |
| A_RstIn | in | 1 | '0' | Reset input in domain A (active high) |
| A_RstOut | out | 1 | N/A | Synchronized reset output in domain A |
| B_Clk | in | 1 | - | Clock of domain B |
| B_RstIn | in | 1 | '0' | Reset input in domain B (active high) |
| B_RstOut | out | 1 | N/A | Synchronized reset output in domain B |
Detailed Description¶
The component behaves identically to olo_base_cc_reset. See that component's documentation
for the full protocol description. The entity is structurally identical to olo_base_cc_reset;
the only difference is that each of the two internal acknowledge-path synchronizers is a
TMR-hardened olo_ft_cc_bits instead of the non-TMR olo_base_cc_bits.
This protects the ack paths against single-event upsets in radiation environments.
Note that the local request-path registers (RstALatch, RstBLatch, RstRqstB2A,
RstRqstA2B) are not manually triplicated in this entity. They should be covered by
vendor TMR (syn_radhardlevel = "tmr") as part of the surrounding radiation-hardened design.
Relationship to Other Components¶
- olo_base_cc_reset: the non-TMR version with the same interface
- olo_ft_cc_pulse: uses
olo_ft_cc_resetinternally for reset crossing
References¶
[1] Y. Li, B. Nelson, and M. Wirthlin, "Synchronization Techniques for Crossing Multiple Clock Domains in FPGA-Based TMR Circuits," IEEE Transactions on Nuclear Science, vol. 57, no. 6, pp. 3506-3514, Dec. 2010. DOI: 10.1109/TNS.2010.2086075